"A gate-aware GRU model with trend-residual decomposition and quantile ..."

Weibo Wang et al. (2025)

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DOI: 10.1016/J.MEJO.2025.106852

access: closed

type: Journal Article

metadata version: 2025-09-21

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Weibo Wang, Xinyu Wen, Mingze Zhang, Yiming Wang, Yongkang Zheng, Mingmao Gong, Dong Liu:
A gate-aware GRU model with trend-residual decomposition and quantile regression for remaining useful life prediction of IGBT. Microelectron. J. 165: 106852 (2025)

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