Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A prognostic method for the embedded failure monitoring of solder ..."

Juha-Veikko Voutilainen et al. (2009)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2007.09.009

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/VoutilainenPMJ09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/VoutilainenPMJ09
Juha-Veikko Voutilainen, Jussi Putaala, Markku Moilanen, Heli Jantunen:
A prognostic method for the embedded failure monitoring of solder interconnections with 1149.4 test bus architecture. Microelectron. J. 40(7): 1069-1080 (2009)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.