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"TID effects on I-V characteristics of bulk CMOS STD and ELT-based devices ..."

Pablo Ilha Vaz et al. (2020)

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DOI: 10.1016/J.MEJO.2020.104722

access: closed

type: Journal Article

metadata version: 2021-10-14

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Pablo Ilha Vaz, Gilson I. Wirth, Fábio Fedrizzi Vidor, Thiago Hanna Both:
TID effects on I-V characteristics of bulk CMOS STD and ELT-based devices in 600 nm. Microelectron. J. 97: 104722 (2020)

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