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"Sram cell stability metric under transient voltage noise."

Elena I. Vatajelu et al. (2014)

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DOI: 10.1016/J.MEJO.2013.11.005

access: closed

type: Journal Article

metadata version: 2020-04-16

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  - journals/mj/VatajeluGRF14
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  - https://dblp.org/rec/journals/mj/VatajeluGRF14
Elena I. Vatajelu, Álvaro Gómez-Pau, Michel Renovell, Joan Figueras:
Sram cell stability metric under transient voltage noise. Microelectron. J. 45(10): 1348-1353 (2014)

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