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"RLDA: Valid test pattern identification by machine learning classification ..."

Tai Song, Zhengfeng Huang, Xiaohui Guo (2022)

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DOI: 10.1016/J.MEJO.2022.105549

access: closed

type: Journal Article

metadata version: 2022-11-13

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Tai Song, Zhengfeng Huang, Xiaohui Guo:
RLDA: Valid test pattern identification by machine learning classification method for VLSI test. Microelectron. J. 128: 105549 (2022)

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