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"Test power and area optimized logic built-in self-test with higher fault ..."
Vishnupriya Shivakumar, Chinnaiyan Senthilpari, Zubaida Binti Yusoff (2022)
- Vishnupriya Shivakumar
, Chinnaiyan Senthilpari, Zubaida Binti Yusoff
:
Test power and area optimized logic built-in self-test with higher fault coverage for automobile SoCs. Microelectron. J. 124: 105430 (2022)
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