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"Electro-thermal characterization and simulation of integrated ..."

J. Rhayem et al. (2012)

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DOI: 10.1016/J.MEJO.2011.09.010

access: closed

type: Journal Article

metadata version: 2020-11-05

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  - journals/mj/RhayemBBBHPDGWT12
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  - https://dblp.org/rec/journals/mj/RhayemBBBHPDGWT12
J. Rhayem, B. Besbes, Raul Blecic, Sergey Bychikhin, Georg Haberfehlner, Dionyz Pogany, B. Desoete, Renaud Gillon, Aarnout Wieers, Marnix Tack:
Electro-thermal characterization and simulation of integrated multi-trenched XtreMOS^TM power devices. Microelectron. J. 43(9): 618-623 (2012)

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