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"Electrical modeling of tapered TSV including MOS-Field effect and ..."

Amira Nabil et al. (2020)

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DOI: 10.1016/J.MEJO.2020.104797

access: closed

type: Journal Article

metadata version: 2020-06-12

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Amira Nabil, Jose A. Bernardo, Yue Ma, Mohamed Abouelatta, Ahmed Shaker, Latifa Fakri-Bouchet, Hani F. Ragai, Christian Gontrand:
Electrical modeling of tapered TSV including MOS-Field effect and substrate parasitics: Analysis and application. Microelectron. J. 100: 104797 (2020)

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