"Statistical yield improvement under process variations of multi-valued ..."

Hassan Mostafa, Yehea Ismail (2016)

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DOI: 10.1016/J.MEJO.2016.02.006

access: closed

type: Journal Article

metadata version: 2020-02-22

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Hassan Mostafa, Yehea Ismail:
Statistical yield improvement under process variations of multi-valued memristor-based memories. Microelectron. J. 51: 46-57 (2016)

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