"Charge pumping test technique using CMOS ring oscillator on leakage issue."

Yongbo Liu et al. (2017)

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DOI: 10.1016/J.MEJO.2017.08.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yongbo Liu, Zhengyong Zhu, Huilong Zhu, Guangxing Wan, Junfeng Li, Chao Zhao:
Charge pumping test technique using CMOS ring oscillator on leakage issue. Microelectron. J. 68: 40-43 (2017)

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