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"Variations of single event transient induced by line edge roughness (LER) ..."

Baojun Liu, Xiaokuo Yang, Jing Zhu (2024)

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DOI: 10.1016/J.MEJO.2023.106063

access: closed

type: Journal Article

metadata version: 2024-02-29

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Baojun Liu, Xiaokuo Yang, Jing Zhu:
Variations of single event transient induced by line edge roughness (LER) and temperature in FinFET. Microelectron. J. 144: 106063 (2024)

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