"Characterization of Ge2Sb2Te5 thin film ..."

Feifei Liao et al. (2006)

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DOI: 10.1016/J.MEJO.2005.10.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Feifei Liao, Yiqing Ding, Yinyin Lin, Tingao Tang, Baowei Qiao, Yunfeng Lai, Jie Feng, Bomy Chen:
Characterization of Ge₂Sb₂Te₅ thin film transistor and its application in non-volatile memory. Microelectron. J. 37(8): 841-844 (2006)

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