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"Assessment of structure variation in silicon nanowire FETs and impact on SRAM."

Yi-Bo Liao et al. (2012)

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DOI: 10.1016/J.MEJO.2011.12.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/mj/LiaoCKH12
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  - https://dblp.org/rec/journals/mj/LiaoCKH12
Yi-Bo Liao, Meng-Hsueh Chiang, Keunwoo Kim, Wei-Chou Hsu:
Assessment of structure variation in silicon nanowire FETs and impact on SRAM. Microelectron. J. 43(5): 300-304 (2012)

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