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"An implementation of hot-swap circuit with high reliability."

Dagang Li et al. (2020)

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DOI: 10.1016/J.MEJO.2020.104777

access: closed

type: Journal Article

metadata version: 2022-07-28

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  - https://dblp.org/rec/journals/mj/LiLLFWCZFH20
Dagang Li, Zehong Li, Wei Li, Hua Fan, Ce Wang, Hongrui Che, Xuanhong Zeng, Quanyuan Feng, Hadi Heidari:
An implementation of hot-swap circuit with high reliability. Microelectron. J. 100: 104777 (2020)

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