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"Single-event burnout hardening evaluation with current and electric field ..."

Yibo Lei et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105692

access: closed

type: Journal Article

metadata version: 2023-03-28

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  - https://dblp.org/rec/journals/mj/LeiFLZYTYZ23
Yibo Lei, Jian Fang, Yingdong Liang, Yisen Zhang, Ling Yan, Lingli Tang, Xihe Yang, Bo Zhang:
Single-event burnout hardening evaluation with current and electric field redistribution of high voltage LDMOS transistors based on TCAD Simulations. Microelectron. J. 132: 105692 (2023)

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