"Microstructure analysis in strained-InGaN/GaN multiple quantum wells."

Huaping Lei et al. (2009)

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DOI: 10.1016/J.MEJO.2008.07.068

access: closed

type: Journal Article

metadata version: 2020-02-22

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Huaping Lei, Jun Chen, Xunya Jiang, Gérard Nouet:
Microstructure analysis in strained-InGaN/GaN multiple quantum wells. Microelectron. J. 40(2): 342-345 (2009)

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