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"Modeling of inner-outer gates and temperature dependent gate-induced drain ..."

Nitish Kumar et al. (2024)

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DOI: 10.1016/J.MEJO.2024.106155

access: closed

type: Journal Article

metadata version: 2024-05-31

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Nitish Kumar, Aakanksha Mishra, Ankur Gupta, Pushpapraj Singh:
Modeling of inner-outer gates and temperature dependent gate-induced drain leakage current of junctionless double-gate-all-around FET. Microelectron. J. 146: 106155 (2024)

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