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"Dynamic reliability management based on resource-based EM modeling for ..."
Taeyoung Kim, Zao Liu, Sheldon X.-D. Tan (2018)
- Taeyoung Kim, Zao Liu, Sheldon X.-D. Tan:
Dynamic reliability management based on resource-based EM modeling for multi-core microprocessors. Microelectron. J. 74: 106-115 (2018)
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