"Exploring the impact of sheet thickness scaling on Nanosheet FET gate ..."

Ramandeep Kaur, Nihar R. Mohapatra (2025)

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DOI: 10.1016/J.MEJO.2024.106480

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type: Journal Article

metadata version: 2025-01-13

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Ramandeep Kaur, Nihar R. Mohapatra:
Exploring the impact of sheet thickness scaling on Nanosheet FET gate electrostatics using k.p based simulations. Microelectron. J. 156: 106480 (2025)

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