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"A new fault current-sensing scheme for fast fault protection of the ..."
In-Hwan Ji et al. (2008)
- In-Hwan Ji, Min-Woo Ha, Young-Hwan Choi, Seung-Chul Lee, Chong-Man Yun, Min-Koo Han:
A new fault current-sensing scheme for fast fault protection of the insulated gate bipolar transistor. Microelectron. J. 39(6): 908-913 (2008)
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