"Improved modeling of flicker noise including velocity saturation effect in ..."

Ravi Goel, Weike Wang, Yogesh Singh Chauhan (2021)

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DOI: 10.1016/J.MEJO.2021.105020

access: closed

type: Journal Article

metadata version: 2021-04-29

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Ravi Goel, Weike Wang, Yogesh Singh Chauhan:
Improved modeling of flicker noise including velocity saturation effect in FinFETs and experimental validation. Microelectron. J. 110: 105020 (2021)

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