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"Vacuum UV spectroscopic ellipsometry study on ..."
T. H. Ghong et al. (2008)
- T. H. Ghong, T. J. Kim, S. Y. Lee, Y. D. Kim, J. J. Kim, Hisao Makino
, T. Yao:
Vacuum UV spectroscopic ellipsometry study on Ga1-xCrxN(0<=x<=0.1) alloy films. Microelectron. J. 39(3-4): 541-543 (2008)
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