"Improving uniformity and reliability of SRAM PUFs utilizing device aging ..."

Achiranshu Garg et al. (2019)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2019.05.013

access: closed

type: Journal Article

metadata version: 2021-08-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/GargLLK19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/GargLLK19
Achiranshu Garg, Zhao Chuan Lee, Lu Lu, Tony Tae-Hyoung Kim:
Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation. Microelectron. J. 90: 29-38 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.