"A wafer-level three-step calibration technique for BJT-based CMOS ..."

Ying Gao, Xin Liu, Yanfeng Jiang (2023)

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DOI: 10.1016/J.MEJO.2022.105671

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type: Journal Article

metadata version: 2023-01-31

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Ying Gao, Xin Liu, Yanfeng Jiang:
A wafer-level three-step calibration technique for BJT-based CMOS temperature sensor. Microelectron. J. 131: 105671 (2023)

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