"Thermal transient measurement of insulated gate devices using the thermal ..."

Gabor Farkas, Gergely Simon (2015)

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DOI: 10.1016/J.MEJO.2015.06.027

access: closed

type: Journal Article

metadata version: 2021-10-14

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Gabor Farkas, Gergely Simon:
Thermal transient measurement of insulated gate devices using the thermal properties of the channel resistance and parasitic elements. Microelectron. J. 46(12): 1185-1194 (2015)

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