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"Multiphysics simulation study of thermal stress effects in nanoscale ..."
Huali Duan et al. (2024)
- Huali Duan, Erping Li, Qinyi Huang, Yuehang Xu, Wenchao Chen:
Multiphysics simulation study of thermal stress effects in nanoscale FinFETs heterogeneously integrated with GaN high-power device on silicon substrate. Microelectron. J. 150: 106286 (2024)
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