Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Frequency-scaled thermal-aware test scheduling for 3D ICs using machine ..."

Subhajit Chatterjee et al. (2022)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2022.105535

access: closed

type: Journal Article

metadata version: 2022-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/ChatterjeeRGR22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/ChatterjeeRGR22
Subhajit Chatterjee, Surajit Kumar Roy, Chandan Giri, Hafizur Rahaman:
Frequency-scaled thermal-aware test scheduling for 3D ICs using machine learning based temperature estimation. Microelectron. J. 128: 105535 (2022)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.