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"Electrical modeling of the sensitivity to misalignments of a class-E based ..."

Mondher Chaoui et al. (2012)

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DOI: 10.1016/J.MEJO.2012.07.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mj/ChaouiPGL12
Mondher Chaoui, Richard Perdriau, Hamadi Ghariani, Mongi Lahiani:
Electrical modeling of the sensitivity to misalignments of a class-E based inductive transcutaneous link. Microelectron. J. 43(11): 721-729 (2012)

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