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"Built-in test for VLSI - pseudorandom techniques: Bardell, P H, McArney, W ..."

Colin Maunder (1989)

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DOI: 10.1016/0141-9331(89)90036-7

access: closed

type: Journal Article

metadata version: 2020-02-22

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Colin Maunder:
Built-in test for VLSI - pseudorandom techniques: Bardell, P H, McArney, W H and Savir, J Wiley, New York, NY, USA (1987) £45.00 pp 354. Microprocess. Microsystems 13(1): 62 (1989)

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