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"Efficient march test for 3-coupling faults in random access memories."

Petru Cascaval, Stuart Bennett (2001)

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DOI: 10.1016/S0141-9331(00)00103-4

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/mam/CascavalB01
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  - https://dblp.org/rec/journals/mam/CascavalB01
Petru Cascaval, Stuart Bennett:
Efficient march test for 3-coupling faults in random access memories. Microprocess. Microsystems 24(10): 501-509 (2001)

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