"Expert system to configure global design for testability structure in a ..."

Sudipta Bhawmik, Parimal Pal Chaudhuri (1989)

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DOI: 10.1016/0141-9331(89)90147-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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Sudipta Bhawmik, Parimal Pal Chaudhuri:
Expert system to configure global design for testability structure in a VLSI circuit. Microprocess. Microsystems 13(7): 462-472 (1989)

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