"Second-order accuracy of depth-based bootstrap confidence regions."

Bei Wei, Stephen M. S. Lee (2012)

> Home

Details and statistics

DOI: 10.1016/J.JMVA.2011.08.016

access: open

type: Journal Article

metadata version: 2021-02-17

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/ma/WeiL12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ma/WeiL12
Bei Wei, Stephen M. S. Lee:
Second-order accuracy of depth-based bootstrap confidence regions. J. Multivar. Anal. 105(1): 112-123 (2012)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.