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"Few-shot defect recognition for the multi-domain industry via attention ..."
Yingtao Su et al. (2024)
- Yingtao Su, Ping Yan, Junyao Lin, Chao Wen, Yong Fan:
Few-shot defect recognition for the multi-domain industry via attention embedding and fine-grained feature enhancement. Knowl. Based Syst. 284: 111265 (2024)
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