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"High-performance one-stage detector for SiC crystal defects based on ..."

Haochen Shi et al. (2023)

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DOI: 10.1016/J.KNOSYS.2023.110994

access: closed

type: Journal Article

metadata version: 2024-01-01

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Haochen Shi, Zhiyuan Jin, Wenjing Tang, Jing Wang, Kai Jiang, Mingsheng Xu, Wei Xia, Xiangang Xu:
High-performance one-stage detector for SiC crystal defects based on convolutional neural network. Knowl. Based Syst. 280: 110994 (2023)

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