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"The Impacts of Self-Construal and Perceived Risk on Technology Readiness."

Jaeun Choi, Dongho Yoo (2021)

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DOI: 10.3390/JTAER16050089

access: open

type: Journal Article

metadata version: 2024-07-19

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  - https://dblp.org/rec/journals/jtaer/ChoiY21
Jaeun Choi, Dongho Yoo:
The Impacts of Self-Construal and Perceived Risk on Technology Readiness. J. Theor. Appl. Electron. Commer. Res. 16(5): 1584-1597 (2021)

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