Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Single-ended SRAM with high test coverage and short test time."

Chua-Chin Wang et al. (2000)

> Home

Details and statistics

DOI: 10.1109/4.818928

access: closed

type: Journal Article

metadata version: 2022-04-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/WangWHK00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/WangWHK00
Chua-Chin Wang, Chi-Feng Wu, Rain-Ted Hwang, Chia-Hsiung Kao:
Single-ended SRAM with high test coverage and short test time. IEEE J. Solid State Circuits 35(1): 114-118 (2000)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.