"RF Transconductor Linearization Robust to Process, Voltage and Temperature ..."

Harish Kundur Subramaniyan et al. (2015)

> Home

Details and statistics

DOI: 10.1109/JSSC.2015.2453964

access: closed

type: Journal Article

metadata version: 2020-08-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/SubramaniyanKSK15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/SubramaniyanKSK15
Harish Kundur Subramaniyan, Eric A. M. Klumperink, Venkatesh Srinivasan, Ali Kiaei, Bram Nauta:
RF Transconductor Linearization Robust to Process, Voltage and Temperature Variations. IEEE J. Solid State Circuits 50(11): 2591-2602 (2015)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.