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"A detailed analysis of CMOS SRAM's with gate oxide short defects."

Jaume Segura, Antonio Rubio (1997)

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DOI: 10.1109/4.634662

access: closed

type: Journal Article

metadata version: 2023-07-10

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  - https://dblp.org/rec/journals/jssc/SeguraR97
Jaume Segura, Antonio Rubio:
A detailed analysis of CMOS SRAM's with gate oxide short defects. IEEE J. Solid State Circuits 32(10): 1543-1550 (1997)

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