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"Design for concurrent error detection and testability in storage/logic arrays."

Howard V. Savin et al. (1994)

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DOI: 10.1109/4.303714

access: closed

type: Journal Article

metadata version: 2023-05-03

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  - https://dblp.org/rec/journals/jssc/SavinBSMF94
Howard V. Savin, Mary S. Bucknell, Marc D. Spaulding, Thomas B. Maciukenas, W. Kent Fuchs:
Design for concurrent error detection and testability in storage/logic arrays. IEEE J. Solid State Circuits 29(7): 770-779 (1994)

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