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"Accurate in situ measurement of peak noise and delay change induced by ..."
Takashi Sato et al. (2001)
- Takashi Sato
, Dennis Sylvester, Yu Cao, Chenming Hu:
Accurate in situ measurement of peak noise and delay change induced by interconnect coupling. IEEE J. Solid State Circuits 36(10): 1587-1591 (2001)
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