"CMOS stuck-open fault testability."

Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana (1989)

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DOI: 10.1109/4.16323

access: closed

type: Journal Article

metadata version: 2024-11-12

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Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana:
CMOS stuck-open fault testability. IEEE J. Solid State Circuits 24(1): 193-194 (1989)

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