"Transistor noise in SiGe HBT RF technology."

Guofu Niu et al. (2001)

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DOI: 10.1109/4.944672

access: closed

type: Journal Article

metadata version: 2022-04-04

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Guofu Niu, Zhenrong Jin, John D. Cressler, Rao Rapeta, Alvin J. Joseph, David L. Harame:
Transistor noise in SiGe HBT RF technology. IEEE J. Solid State Circuits 36(9): 1424-1427 (2001)

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