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"A built-in technique for probing power supply and ground noise ..."

Makoto Nagata, Takeshi Okumoto, Kazuo Taki (2005)

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DOI: 10.1109/JSSC.2005.845559

access: closed

type: Journal Article

metadata version: 2022-04-09

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Makoto Nagata, Takeshi Okumoto, Kazuo Taki:
A built-in technique for probing power supply and ground noise distribution within large-scale digital integrated circuits. IEEE J. Solid State Circuits 40(4): 813-819 (2005)

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