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"An On-Chip Test Structure and Digital Measurement Method for Statistical ..."
Saibal Mukhopadhyay et al. (2008)
- Saibal Mukhopadhyay, Keunwoo Kim, Keith A. Jenkins, Ching-Te Chuang, Kaushik Roy:
An On-Chip Test Structure and Digital Measurement Method for Statistical Characterization of Local Random Variability in a Process. IEEE J. Solid State Circuits 43(9): 1951-1963 (2008)
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