"A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm."

Zhen-Yu Liang, Hao-Hsuan Wei, Tsung-Te Liu (2020)

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DOI: 10.1109/JSSC.2019.2942374

access: closed

type: Journal Article

metadata version: 2020-08-30

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Zhen-Yu Liang, Hao-Hsuan Wei, Tsung-Te Liu:
A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm. IEEE J. Solid State Circuits 55(3): 817-825 (2020)

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