"Optimized redundancy selection based on failure-related yield model for ..."

Shigeru Kikuda et al. (1991)

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DOI: 10.1109/4.98971

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type: Journal Article

metadata version: 2025-02-26

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Shigeru Kikuda, Hiroshi Miyamoto, Shigeru Mori, Mitsutaka Niiro, Michihiro Yamada:
Optimized redundancy selection based on failure-related yield model for 64-Mb DRAM and beyond. IEEE J. Solid State Circuits 26(11): 1550-1555 (1991)

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