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"A study of hot-carrier-induced mismatch drift: a reliability issue for ..."

Yoonjong Huh, Yungkwon Sung, Sung-Mo Kang (1998)

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DOI: 10.1109/4.678661

access: closed

type: Journal Article

metadata version: 2022-07-05

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Yoonjong Huh, Yungkwon Sung, Sung-Mo Kang:
A study of hot-carrier-induced mismatch drift: a reliability issue for VLSI circuits. IEEE J. Solid State Circuits 33(6): 921-927 (1998)

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