"Optimized test circuits for SER characterization of a manufacturing process."

Peter Hazucha, Christer Svensson (2000)

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DOI: 10.1109/4.823440

access: closed

type: Journal Article

metadata version: 2022-04-08

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Peter Hazucha, Christer Svensson:
Optimized test circuits for SER characterization of a manufacturing process. IEEE J. Solid State Circuits 35(2): 142-148 (2000)

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