"Large-Scale SRAM Variability Characterization in 45 nm CMOS."

Zheng Guo et al. (2009)

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DOI: 10.1109/JSSC.2009.2032698

access: closed

type: Journal Article

metadata version: 2020-08-30

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Zheng Guo, Andrew Carlson, Liang-Teck Pang, Kenneth Duong, Tsu-Jae King Liu, Borivoje Nikolic:
Large-Scale SRAM Variability Characterization in 45 nm CMOS. IEEE J. Solid State Circuits 44(11): 3174-3192 (2009)

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