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"Performance and reliability comparison between asymmetric and symmetric ..."

Jone F. Chen et al. (1999)

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DOI: 10.1109/4.748188

access: closed

type: Journal Article

metadata version: 2024-06-12

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Jone F. Chen, Jiang Tao, Peng Fang, Chenming Hu:
Performance and reliability comparison between asymmetric and symmetric LDD devices and logic gates. IEEE J. Solid State Circuits 34(3): 367-371 (1999)

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